An optoelectronic defect detection method and system insensitive to yarn speed

Musayev E.

JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS, cilt.6, sa.7, ss.721-724, 2004 (SCI-Expanded) identifier identifier

  • Yayın Türü: Makale / Tam Makale
  • Cilt numarası: 6 Sayı: 7
  • Basım Tarihi: 2004
  • Doi Numarası: 10.1088/1464-4258/6/7/011
  • Dergi Adı: JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS
  • Derginin Tarandığı İndeksler: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Sayfa Sayıları: ss.721-724
  • Bursa Uludağ Üniversitesi Adresli: Hayır

Özet

Analysis of optical methods and systems used to detect defects of a yam, e.g. chenille yam which will simply be called yam throughout the paper, indicates that the detection results in current methods and systems depend on the yarn speed. In this paper, we report on an optical diagram with a wide-angled light emitter that has been developed to show the optical method of defect detection. The equation expressing the difference between the real defect length and the shadow length or detected defect length formed on the detection surface is obtained.