Modeling of geometrical effects of thick film components on their microwave performance


Lu S., Hayes M., Fidanboylu K. , Elshabini-Riad A.

Hybrid circuit technology, vol.7, no.2, pp.29-33, 1990 (Refereed Journals of Other Institutions) identifier

  • Publication Type: Article / Article
  • Volume: 7 Issue: 2
  • Publication Date: 1990
  • Title of Journal : Hybrid circuit technology
  • Page Numbers: pp.29-33

Abstract

The article presented the results of a wideband characterization and modeling of the aspect ratio factor, the resistor area factor, and the laser trim effect of thick film resistor elements on their high frequency performance. Time domain measurement techniques are used in order to model these elements. Electrical network models describing the element performance over a wideband frequency range are thus obtained in the time domain by using MTCAP and verified in the frequency domain by using PSPICE.