Akademik Veri Yönetim Sistemi
6th International Eurasian Conference on Science, Engineering and Technology (EurasianSciEnTech 2025), Ankara, Türkiye, 25 - 27 Haziran 2025, ss.138, (Özet Bildiri)
In this study, undoped ZnO and different amounts of Al doped ZnO (AZO) thin films were prepared on glass substrates by sol-gel spin-coating method. In order to see the effects on the structural properties, morphology and optical properties of the films, the initial precursor concentration was changed by adding Al at 1%, 3%, 5% and 7%. The films were characterized by UV-vis transmittance measurements, X-ray diffraction (XRD) and scanning electron microscopy (SEM-EDS). In addition, ZnO and AZO thin films produced by sol-gel spin-coating technique were analyzed with the contact angle device. XRD measurements revealed that all the obtained films were polycrystalline with hexagonal structure. Absorption and transmittance measurements were taken to determine the forbidden energy band gap of the prepared undoped and doped ZnO thin films. The absorption spectrum of ZnO and AZO thin films varies significantly with Al content, especially in the 300-400 nm UV region. All films have high transmittance in the visible range (400-800 nm) at 85-95%. The optical band gap of all films was investigated by measuring the optical absorbance depending on the wavelength and was found to be between 3.2-3.3 eV. In addition, SEM analysis was performed to obtain a detailed understanding of the surface morphology of the thin films. The elemental composition was examined by EDX. The SEM image of Al-doped ZnO reveals a more homogeneous and smoother structure compared to undoped ZnO. Surface contact measurements were determined to support the SEM analysis for surface morphology (roughness). The change in contact angle indicates the increase or decrease in the surface roughness of the film. The results are consistent with the SEM images.