Time Domain Modeling of Microwave Devices Using the Modified Transient Circuit Analysis Package


FİDANBOYLU K. , RIAD S., RIAD A. E.

Intl. Symp. on Electromagnetic Metrology, Beijing, China, 19 - 22 August 1989, pp.72-76

  • Publication Type: Conference Paper / Full Text
  • City: Beijing
  • Country: China
  • Page Numbers: pp.72-76