A new approach to planar structure characterization using time domain techniques


Fidanboylu K. , Muthukrishnan N., Riad S., Elshabini-Riad A.

31st ARFTG Conference Digest - Spring 1988, New York, United States Of America, 24 May 1988, pp.19-28 identifier

  • Publication Type: Conference Paper / Full Text
  • Volume:
  • Doi Number: 10.1109/arftg.1988.323898
  • City: New York
  • Country: United States Of America
  • Page Numbers: pp.19-28

Abstract

© 1988 IEEE.A new approach for planar transmission line characterization is presented. The approach is based on using time domain techniques for characterizing the coaxial to planar adapter probes used in the measurements. The characterization is achieved by developing an equivalent network model for the probes with the aid of a transient circuit analysis computer program.