A new approach to planar structure characterization using time domain techniques

Fidanboylu K., Muthukrishnan N., Riad S., Elshabini-Riad A.

31st ARFTG Conference Digest - Spring 1988, New York, Amerika Birleşik Devletleri, 24 Mayıs 1988, ss.19-28 identifier

  • Yayın Türü: Bildiri / Tam Metin Bildiri
  • Cilt numarası:
  • Doi Numarası: 10.1109/arftg.1988.323898
  • Basıldığı Şehir: New York
  • Basıldığı Ülke: Amerika Birleşik Devletleri
  • Sayfa Sayıları: ss.19-28
  • Bursa Uludağ Üniversitesi Adresli: Hayır

Özet

© 1988 IEEE.A new approach for planar transmission line characterization is presented. The approach is based on using time domain techniques for characterizing the coaxial to planar adapter probes used in the measurements. The characterization is achieved by developing an equivalent network model for the probes with the aid of a transient circuit analysis computer program.