Gain limits of a Thick GEM in high-purity Ne, Ar and Xe

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Miyamoto J., Breskin A., Peskov V.

JOURNAL OF INSTRUMENTATION, vol.5, 2010 (SCI-Expanded) identifier

  • Publication Type: Article / Article
  • Volume: 5
  • Publication Date: 2010
  • Doi Number: 10.1088/1748-0221/5/05/p05008
  • Journal Name: JOURNAL OF INSTRUMENTATION
  • Journal Indexes: Science Citation Index Expanded (SCI-EXPANDED), Scopus
  • Keywords: Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MICROMEGAS, InGrid, etc), Avalanche-induced secondary effects, Gaseous detectors, Electron multipliers (gas), PHOTOSENSITIVE GASEOUS DETECTORS, DARK-MATTER, OPERATION, SCINTILLATION, EMISSION, ARGON, MECHANISM, MIXTURES, KRYPTON, HELIUM
  • Bursa Uludag University Affiliated: No

Abstract

The dependence of the avalanche charge gain in Thick Gas Electron Multipliers (THGEM) on the purity of Ne, Ar and Xe filling gases was investigated. The gain, measured with alpha-particles in standard conditions (atmospheric pressure, room temperature), was found to considerably drop in gases purified by non-evaporable getters. On the other hand, small N-2 admixtures to noble gases resulted in high reachable gains. The results are of general relevance in the operation of gas-avalanche detectors in noble gases, particularly that of two-phase cryogenic detectors for rare events.