FİDANBOYLU, K. And RIAD, S. 1989. Calibrated Wideband Measurement of Packaged Devices Using Transient Analysis Techniques. 3rd Intl. SAMPE Electronics Conf. , (LOS ANGELES, CALIFORNIA, United States Of America), 516-527.

FİDANBOYLU, K., & RIAD, S., (1989). Calibrated Wideband Measurement of Packaged Devices Using Transient Analysis Techniques . 3rd Intl. SAMPE Electronics Conf. (pp.516-527). LOS ANGELES, CALIFORNIA, United States Of America

FİDANBOYLU, KEMAL, And SEDKI RIAD. "Calibrated Wideband Measurement of Packaged Devices Using Transient Analysis Techniques," 3rd Intl. SAMPE Electronics Conf., LOS ANGELES, CALIFORNIA, United States Of America, 1989

FİDANBOYLU, KEMAL And RIAD, SEDKI. "Calibrated Wideband Measurement of Packaged Devices Using Transient Analysis Techniques." 3rd Intl. SAMPE Electronics Conf. , LOS ANGELES, CALIFORNIA, United States Of America, pp.516-527, 1989

FİDANBOYLU, K. And RIAD, S. (1989) . "Calibrated Wideband Measurement of Packaged Devices Using Transient Analysis Techniques." 3rd Intl. SAMPE Electronics Conf. , LOS ANGELES, CALIFORNIA, United States Of America, pp.516-527.

@conferencepaper{conferencepaper, author={KEMAL FİDANBOYLU And author={SEDKI RIAD}, title={Calibrated Wideband Measurement of Packaged Devices Using Transient Analysis Techniques}, congress name={3rd Intl. SAMPE Electronics Conf.}, city={LOS ANGELES, CALIFORNIA}, country={United States Of America}, year={1989}, pages={516-527} }