Fidanboylu, K. And Riad, S. M. 1989. Calibrated wideband measurement of packaged devices. 3rd International SAMPE Electronics Conference: Electronic Materials and Processes , (Los-Angeles, Chile), 516-527.

Fidanboylu, K., & Riad, S. M., (1989). Calibrated wideband measurement of packaged devices . 3rd International SAMPE Electronics Conference: Electronic Materials and Processes (pp.516-527). Los-Angeles, Chile

Fidanboylu, KEMAL, And Sedki M. Riad. "Calibrated wideband measurement of packaged devices," 3rd International SAMPE Electronics Conference: Electronic Materials and Processes, Los-Angeles, Chile, 1989

Fidanboylu, KEMAL And Riad, Sedki M. . "Calibrated wideband measurement of packaged devices." 3rd International SAMPE Electronics Conference: Electronic Materials and Processes , Los-Angeles, Chile, pp.516-527, 1989

Fidanboylu, K. And Riad, S. M. (1989) . "Calibrated wideband measurement of packaged devices." 3rd International SAMPE Electronics Conference: Electronic Materials and Processes , Los-Angeles, Chile, pp.516-527.

@conferencepaper{conferencepaper, author={KEMAL FİDANBOYLU And author={Sedki M. Riad}, title={Calibrated wideband measurement of packaged devices}, congress name={3rd International SAMPE Electronics Conference: Electronic Materials and Processes}, city={Los-Angeles}, country={Chile}, year={1989}, pages={516-527} }