Avcibas, I. Et Al. 2002. Image steganalysis with binary similarity measures. IEEE International Conference on Image Processing , (New-York, United States Of America), 645-648.

Avcibas, I., Memon, N., & Sankur, B., (2002). Image steganalysis with binary similarity measures . IEEE International Conference on Image Processing (pp.645-648). New-York, United States Of America

Avcibas, I, N Memon, And B Sankur. "Image steganalysis with binary similarity measures," IEEE International Conference on Image Processing, New-York, United States Of America, 2002

Avcibas, I Et Al. "Image steganalysis with binary similarity measures." IEEE International Conference on Image Processing , New-York, United States Of America, pp.645-648, 2002

Avcibas, I. Memon, N. And Sankur, B. (2002) . "Image steganalysis with binary similarity measures." IEEE International Conference on Image Processing , New-York, United States Of America, pp.645-648.

@conferencepaper{conferencepaper, author={I Avcibas Et Al. }, title={Image steganalysis with binary similarity measures}, congress name={IEEE International Conference on Image Processing}, city={New-York}, country={United States Of America}, year={2002}, pages={645-648} }