Kahraman, A. Et Al. 2015. Effects of packing materials on the sensitivity of RadFET with HfO2 gate dielectric for electron and photon sources. RADIATION EFFECTS AND DEFECTS IN SOLIDS , vol.170, no.10 , 832-844.

Kahraman, A., Yilmaz, E., Kaya, S., & Aktag, A., (2015). Effects of packing materials on the sensitivity of RadFET with HfO2 gate dielectric for electron and photon sources. RADIATION EFFECTS AND DEFECTS IN SOLIDS , vol.170, no.10, 832-844.

Kahraman, AYŞEGÜL Et Al. "Effects of packing materials on the sensitivity of RadFET with HfO2 gate dielectric for electron and photon sources," RADIATION EFFECTS AND DEFECTS IN SOLIDS , vol.170, no.10, 832-844, 2015

Kahraman, AYŞEGÜL Et Al. "Effects of packing materials on the sensitivity of RadFET with HfO2 gate dielectric for electron and photon sources." RADIATION EFFECTS AND DEFECTS IN SOLIDS , vol.170, no.10, pp.832-844, 2015

Kahraman, A. Et Al. (2015) . "Effects of packing materials on the sensitivity of RadFET with HfO2 gate dielectric for electron and photon sources." RADIATION EFFECTS AND DEFECTS IN SOLIDS , vol.170, no.10, pp.832-844.

@article{article, author={AYŞEGÜL KAHRAMAN Et Al. }, title={Effects of packing materials on the sensitivity of RadFET with HfO2 gate dielectric for electron and photon sources}, journal={RADIATION EFFECTS AND DEFECTS IN SOLIDS}, year=2015, pages={832-844} }